Rub Resistance Tester (Scuff Tester)
The Rub Resistance Tester (Scuff Tester) is a precision laboratory instrument designed to evaluate the rub-proofness and ink durability of printed paper and board. By simulating real-world friction under controlled pressure, it measures the resistance of printed surfaces against scuffing or color transfer. Essential for packaging manufacturers and commercial printers, this equipment ensures that your print quality remains intact during transit and handling, serving as a vital benchmark for batch-to-batch quality consistency.
Product Overview
The Vertex Rub Resistance Tester is engineered to provide a scientific "Inference" of print quality. It works on the principle of rubbing two samples of the same substrate against each other in the same plane. This direct comparison method is the industry standard for determining whether the ink or coating will peel, smudge, or transfer when subjected to friction.
Technical Specifications
| Parameter | Specification |
|---|---|
| Specimen Size | 2 inch and 4.5 inches Diameter |
| Weight on Sample | 2psi & 4psi separate weights |
| Controls | Digital Preset Cycle counter |
| No. of Cycles | 0 - 9999, 9999 |
| Paint | Powder coated & Chromate finished |
| Input Power | 230 Volts, 50/60Hz, single phase supply |
Advanced Features
High-Torque Drive System
Powered by a high-torque Step Synchronous motor that assures accurate R.P.M. of rotating disks. This provides stable motion and very low noise levels for a quiet laboratory environment.
Electronic Control Unit
Features user-friendly electronic controls for seamless operation. Includes a non-contact type sensor for the rub counter, making the system maintenance-free and highly reliable.
Sturdy & Compact Design
Built with a compact but sturdy chassis that ensures the highest degree of parallelism between disc samples. Its space-saving design does not compromise on structural rigidity.
Energy Efficient Operation
Engineered for high performance with very low power consumption (less than 100W). Ideal for long testing cycles without excessive energy costs or heat generation.